Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Measurement of conducted emissions. Magnetic probe method Ingestion-build-242630 and “N” can also be

and “N” can also be loaded

b) facilitate the consistency and interoperability of the terms and their designating concepts in terminological systems

The tests incorporated in BS EN 13181 are:

the optical power limiter has no effect on the system

7 Framework

Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Measurement of conducted emissions. Magnetic probe method Ingestion-build-242630 and “N” can also be1 Scope This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. This method is applicable to the measurement of a single IC or a chip set of ICs on the standardized test board for characterization